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The following list of courses are available to expert level certification. Contact us of details of course content and topics covered.
KLA-Tencor Metrology Equipment
8100XP critical dimension scanning electron microscope (CDSEM)
SP1 & SP2 unpatterned surface inspection
AIT II / UX / XP darkfield patterned wafer inspection
2139 brightfield wafer inspection
ASET F5 & Spectra 100 thin film metrology
Archer & 5300 overlay inspection
The above Kla Tencor logo (®) and the companies respective equipment model names are all registered ® trade marks of KLA Tencor Inc.
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